Why it matters
iPCL-M emphasizes layout quality metrics and optimization guidance on a pre-trained backbone—best evaluated alongside Benchmark metrics and physical-implementation feedback.
Citation entry
Xinhua Lai, He Liu, Weiguo Li, Yihang Qiu, Miao Liu, Simin Tao, Xingquan Li*, Jungang Xu, iPCL-M: Pre-training of Chip Layout for Metrics Evaluation and Optimization, in Proceedings of Design Automation Conference (DAC), 2026. (CCF-A)
Product links
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